SOLICITATION NOTICE
66 -- Scanning Transmission Electron Mircroscope Column and Accessories
- Notice Date
- 2/24/2012
- Notice Type
- Presolicitation
- NAICS
- 334516
— Analytical Laboratory Instrument Manufacturing
- Contracting Office
- Department of the Navy, Office of Naval Research, Naval Research Laboratory, 4555 Overlook Ave. S.W., Washington, District of Columbia, 20375
- ZIP Code
- 20375
- Solicitation Number
- N00173-12-R-LY01
- Point of Contact
- Lauren A. Gooding, Phone: 2027673003
- E-Mail Address
-
lauren.gooding@nrl.navy.mil
(lauren.gooding@nrl.navy.mil)
- Small Business Set-Aside
- N/A
- Description
- The Naval Research Laboratory (NRL) intends to negotiate a contract on the basis of Other Than Full and Open Competition IAW 10 USC 2304(c)(1), only one responsible source. NRL will negotiate with Nion, Inc, 1102 8th St., Kirkland, WA 98033, for a Scanning Transmission Electron Microscope (STEM) Column and Accessories. The STEM requires an ultra-high vacuum scanning transmission with a demonstrated capability to image single boron and carbon atoms and a spatial resolution exceeding 80 picometers for imaging of diamond samples. The microscope shall provide ultra-high vacuum (UHV) in the sample area and operate at 60kV, below the displacement energy threshold for graphitically-bonded carbon. The microscope column and all accessories combined, including the field emission gun, aberration corrector, and spectrometers, must be less <12' high, in order to be compatible with the ceiling height of the NRL laboratory space. The minimum requirements for the STEM Column are as follows: (1) The column vacuum pressure must be 1x10-9 torr or lower, in order to maximize the imaging time before degradation of graphene samples exposed to the electron beam. (2) The column must include the electronic optics and detectors necessary for bright-field and dark-field imaging. (3) The microscope column must enable direct imaging of atomic-monolayer samples, with a spatial resolution sufficient to resolve adjacent carbon atoms in graphene, and the sensitivity to image and identify single atoms of B, C, N and O. (4) The column must include a sample exchange chamber with a camera for monitoring sample insertion and removal. (5) The sample stage must provide translation in 3 orthogonal axes (x, y, z). (6) Two types of sample holders must be provided that accommodate standard 3 mm transmission electron microscopy grids. The first type of holder must enable sample translation in three orthogonal axis (x,y,z). The second type of holder must allow tilting of the sample to +/- 25° in two orthogonal directions, in addition to (x,y,z) translation. (7) A sample bake-out chamber separate from the microscope must be provided. (8) The sample translation in the plane of the sample grid (x,y) must be controllable to 2 nm. (9) The column must include a charged couple device (CCD) camera for imaging of ronchiograms. (10) Automation software for computer control of all column functions must be provided. (11) Two (2) PC computers must be provided to interface directly to the microscope electronics and to collect images from the microscope. (12) The height of the microscope, including the column and gun must not exceed 12'. The minimum requirements for the STEM Accessories which include the Cold Field-Emission Electron Gun and a Spherical Aberration Corrector Lens are as follows: The cold-field emission electron gun must (1) operate at a voltage range of at least 60 kV to 200 kV, to enable imaging below the damage displacement threshold of graphitic C-C bonds, and to allow for analysis of samples 100 nm to 200 nm thick. (2) The energy spread of the emitted electrons must be < 0.4 eV at an operating voltage of 200 kV. The spherical aberration corrector lens must (1) be a lens for correction of spherical aberrations of the probe up to 5th order must be provided. (2) The lens must be coupled to the objective lens of the microscope column. In addition there are two optional items in which the Government reserves the right not to exercise. The minimum requirements for each option are listed below: (1)Electron-energy loss (EEL) spectrometer must be compatible with the STEM column. (2) The EEL spectrometer must provide 0.4 eV or better energy resolution, as determined by full-width half maximum of the zero-loss peak width for a 1 second acquisition. (3) The EEL spectrometer must be compatible with maintaining a column vacuum pressure of 10-9 torr or better. (1)Energy dispersive X-ray (EDX) spectrometer must be compatible with the STEM column. (2)The EDX spectrometer must use a silicon-drift detector for cryogen-free operation. (3)The EDX spectrometer must be compatible with maintaining a column vacuum pressure of 10-9 torr or better. Delivery will be required within 365 days of contract award. If the Government exercises the option CLINs, it shall be no later than 6 (six) months from date of award. If Options are exercised they shall be delivered at the time of delivery of CLINs 0001-0003. Other business opportunities for NRL are available at our website http://heron.nrl.navy.mil/contracts/rfplist.htm.
- Web Link
-
FBO.gov Permalink
(https://www.fbo.gov/spg/DON/ONR/N00173/N00173-12-R-LY01/listing.html)
- Place of Performance
- Address: 4555 Overlook Ave SW, Washington, District of Columbia, 20375, United States
- Zip Code: 20375
- Zip Code: 20375
- Record
- SN02682570-W 20120226/120224234920-f13503a9ea615a0897a0e922b674b9cf (fbodaily.com)
- Source
-
FedBizOpps Link to This Notice
(may not be valid after Archive Date)
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