AWARD
70 -- requires the service of the APOLLO 10 Detector system for energy dispersive X-ray analysis and the Hikari camera system for Electron back scattered Diffraction on our Zeiss Neon 40 Mi
- Notice Date
- 10/6/2010
- Notice Type
- Award Notice
- Contracting Office
- N00104 NAVICP MECHANICSBURG PA NAVICP 5450 Carlisle Pike PO Box 2020 Mechanicsburg, PA
- ZIP Code
- 00000
- Solicitation Number
- N0010410QQ975
- Archive Date
- 9/9/2010
- Point of Contact
- Andrew Clarke
- E-Mail Address
-
andrew.r.clarke@navy.mil
(andrew.r.clarke@navy.mil)
- Small Business Set-Aside
- N/A
- Award Number
- N0010410MQ975
- Award Date
- 8/25/2010
- Awardee
- EDAX Inc (DUNS 011655375)<br />
- Award Amount
- 16,592.03
- Line Number
- 0001-0003
- Description
- SOLE SOURCE JUSTIFICATION (FAR 6.303-2) 1.Requisition Number (FAR 6.303-2): 2.Requesting Department (FAR 6.303-2): Department of Mechanical and Astronautical Engineering 3.Contracting Activity (FAR 6.303-2): Naval Postgraduate School Monterey, California 93943 4.Identity of person preparing justification (SUPARS 6.303-2): 5.A brief description of the intended use or application (FAR 6.303-2): The APOLLO 10 Detector system for Energy Dispersive x-ray Spectroscopy analysis (EDS) and the Hikari camera system for Electron Back Scattered Diffraction (EBSD) were procured as attachments on the Zeiss Neon 40 Field emission Scanning Electron Microscope (FESEM) The EDS is for x-ray chemical analysis and the EBSD is for crystallography and texture analysis and are the primary instruments used in MS3202, Failure Analysis, and the systems are demonstrated as well in MS2201, Introduction to Materials. They are used extensively in MS4312, Advanced Materials Characterization Methods. The APOLLO 10 Detector system for energy dispersive X-ray analysis and the Hikari camera system for Electron back scattered Diffraction on our Zeiss Neon 40 Microscope are also used in a variety of ME thesis projects and also supports both thesis work and faculty research in three other departments (AA, ECE and PH). In addition many MAE and Physics department students routinely use this equipment in their thesis projects. Microstructural data collected using this equipment will provide the basis for student thesis research in concert with the requirements of the Educational Skill Requirements established by the Navy for the 570 Naval Engineering Curriculum at NPS. 6.The critical or unique features which are mandatory in its intended use or application that limit their availability to a single source. The necessity for these features should be clearly indicated. Minimum essential requirements must be stated (FAR 6.303-2): The scope of the job request requires the service of the APOLLO 10 Detector system for energy dispersive X-ray analysis and the Hikari camera system for Electron back scattered Diffraction on our Zeiss Neon 40 Microscope system with all components, which include repair mechanical and electrical systems, repair vacuum system such as detector, camera system, valves, gages, connections, etc for energy dispersive X-ray analysis and electron back scattered diffraction on our Zeiss Neon 40 Microscope system for best performance and images, and solve all kinds of problems. These service components must be compatible, both mechanically and electronically, with remaining detector and camera system components and are unique to EDAX Inc. This same company both service and does the repair/replacement of this detector and camera system. EDAX Inc ™s experience combined with their superior training, support, equipment, and technology given to their field service engineer makes them the superior service provider to service APOLLO 10 Detector system for energy dispersive X-ray analysis and the Hikari camera system for Electron back scattered Diffraction on our Zeiss Neon 40 Microscope systems. 7.A statement that no other known product possesses one or a combination of all the required critical features. This statement should elaborate on the steps taken which led to the conclusion that only a particular source or product can meet the requirement (i.e. market survey, investigation of sources) (FAR 6.303-2): This company has installed the APOLLO 10 Detector for energy dispersive X-ray analysis and the Hikari camera system for Electron back scattered Diffraction on our Zeiss Neon 40 Microscope. Both these systems are attached to the Zeiss Microscope but completely operated and computer-controlled through proprietary software by EDAX. The EDAX Inc. provides in field service to repair, install, and test/certify the APOLLO 10 Detector system for energy dispersive X-ray analysis and the Hikari camera system for Electron back scattered Diffraction on our Zeiss Neon 40 Microscope system. In any case, EDAX Inc. is the sole service/part provider for these systems. 8.The existence of patent, copyright, or limiting features: All proprietary hardware and software to operate and carry out data analysis are provided by the manufacturer/supplier of these equipments and only authorized parties who have all the required licenses to these products and their modification and changes can be requested to service these equipments. So only parties who are in possession of the all drawings, circuit diagrams and hardware, electronics and their supplies as well as software including updates can be requested to provide service contract for this equipment. 9.Discuss briefly why the government doesn ™t have a specification and why it cannot write one for the procurement. Discuss also the actions, if any, the agency may take to remove or overcome any barriers to competition before any subsequent acquisition for the supplies or services required (FAR 6.303-2): This is a specialize item of research and educational equipments in a rapidly evolving technology area. It would be infeasible to write a specification that would remain applicable. Repairing/replacement service is required for proper operation of the APOLLO 10 Detector system for energy dispersive X-ray analysis and the Hikari camera system for Electron back scattered Diffraction on our Zeiss Neon 40 Microscope system for lecture and research. The service will allow more sensitive and demanding experimental procedures to be executed with higher control and accuracy producing reliable data. The originating manufacturer solely performs repairing/replacement service and parts on only their equipments. Due to the immense amount of training required to learn each company ™s complex equipment, competing companies do not provide any service to their competitors components.
- Web Link
-
FBO.gov Permalink
(https://www.fbo.gov/spg/DON/NAVSUP/N000104/Awards/N0010410MQ975.html)
- Record
- SN02306876-W 20101008/101006234219-e81d4b26d9d91ef164c07b0e9075e4e9 (fbodaily.com)
- Source
-
FedBizOpps Link to This Notice
(may not be valid after Archive Date)
| FSG Index | This Issue's Index | Today's FBO Daily Index Page |