SOURCES SOUGHT
66 -- RECOVERY - FOCUSED ION BEAM (FIB)/SCANNING ELECTRON MICROSCOPE (SEM)
- Notice Date
- 11/24/2009
- Notice Type
- Sources Sought
- NAICS
- 334516
— Analytical Laboratory Instrument Manufacturing
- Contracting Office
- Department of Commerce, National Institute of Standards and Technology (NIST), Acquisition Management Division, 100 Bureau Drive, Building 301, Room B129, Mail Stop 1640, Gaithersburg, Maryland, 20899-1640
- ZIP Code
- 20899-1640
- Solicitation Number
- AMD-10-SS04
- Archive Date
- 12/23/2009
- Point of Contact
- Eduardo F. Baca, Phone: 3019756388, Joseph L. Widdup, Phone: (301) 975-6324
- E-Mail Address
-
eduardo.baca@nist.gov, joseph.widdup@nist.gov
(eduardo.baca@nist.gov, joseph.widdup@nist.gov)
- Small Business Set-Aside
- N/A
- Description
- RECOVERY - THIS IS NOT A REQUEST FOR QUOTATIONS. INFORMATION RECEIVED WILL BE USED FOR MARKET RESEARCH PURPOSES ONLY. The National Institute of Standards and Technology (NIST) Acquisition Management Division, on behalf of the NIST Electronics and Electrical Engineering Laboratory (EEEL), Optoelectronics Division (OD), seeks detailed written responses to this notice from responsible sources that are capable of providing focused ion beam and scanning electron microscope (FIB/SEM) microscopes. Only manufacturers of new equipment need respond. This equipment is commonly found in research facilities concerned with the preparation of samples for transmission electron microscopy, and the precise modification of electronic circuits. The most common objects viewed or modified in the EEEL OD division are silicon electronics, metals, and other materials with variations on size scales smaller than a micron. In order to provide advances in measurement science for the electronics and electrical community, it is imperative that the microscope provide the ability to characterize and alter materials on the nanoscale level. The Transmission Electron Microscopy (TEM) and the FIB/SEM form one of the most powerful combinations for this goal. In particular, the FIB/SEM allows for the preparation of samples with TEM inspection. In addition, the FIB/SEM allows for advanced materials characterization and modification through the use of Gallium ions and electrons to remove or add material on nanometer size scales. An acquisition for a FIB/SEM that will be initiated after market research is completed will utilize the American Recovery and Reinvestment Act (ARRA) funding. NIST seeks information from responsible sources that manufacture or sell a FIB/SEM that (a) meets the definition of "Commercial Item" in FAR 2.101 (see https://www.acquisition.gov/far/current/html/Subpart%202_1.html#wp1145507) and meets or exceeds the following DRAFT specifications: 1. General Requirements a) The ability to prepare TEM lamella including extraction b) The ability to do basic patterning with the ion beam c) The ability to accept at least 100mm (4") standard Silicon substrates 2. Electron Optics: a) A thermionic Schottky field emitting electron source b) The ability to externally control the electron beam scan c) The ability to detect secondary and backscattered electrons 3. Ion Optics: a) A Gallium Ion source b) The ability to externally control the ion beam scan 4. Gas Deposition: a) The ability to selectively deposit a conductive element for the protection and affixing of lamella from a precursor gas 5. Manipulator: a) The ability to move with at least 100nm resolution b) The ability to measure strain and digitize the data 6. Energy Dispersive Spectroscopy a) A cryogen free Si drift detector capable of detecting x-rays from the sample and creating elemental maps of samples. Requested Information to be Included in Responses to this Notice: 1. Please indicate whether your company manufactures or is an authorized reseller/business partner for an FIB/SEM of any kind and, if so, please provide complete commercial specifications for the FIB/SEM that your company manufactures or sells, including the name of the company that manufactures the FIB/SEM, where it is manufactured, and detailed functional and performance specifications that the product meets. 2. If your organization is an original equipment manufacturer of FIB/SEM's, then please provide the name of company(ies) that are authorized by your organization, as the OEM, to sell your organization's FIB/SEM, as well as their addresses, and a point of contact for the company (name, phone number, fax number and email address). 3. Indicate the number of days, after acceptance of order, which is typical for delivery of FIB/SEM to the intended delivery location. 4. Please provide a complete copy of standard terms and conditions for the FIB/SEM that your organization manufactures or sells, to include, at a minimum: base warranty, available extended warranty (if offered), copy of software license(s) (if applicable), and customary payment terms. 5. Describe available training that can be purchased or may be included with the purchase of the FIB/SEM. 6. Describe customary documentation that is provided with the purchase of the FIB/SEM. 7. Describe optional items that are available for purchase for the FIB/SEM, such as consumables, spares, tools, additional components, ancillary equipment, software licenses, telephone support, etc. 8. If any of the above-referenced NIST FIB/SEM specifications appear to be unduly restrictive, then please indicate which specification you believe is unduly restrictive and indicate how you believe it could be more competitively worded such that it can be met by more than one FIB/SEM manufacturer and still meet the definition of commercial item at FAR 2.101. 9. Indicate whether modifications of the FIB/SEM currently manufactured or sold by your organization would be necessary to meet Government specifications listed in this notice and, if so, indicate whether those modifications be considered minor modifications as described in the FAR Subpart 2.101 definition of commercial item. 10. Indicate the number of persons currently employed by your company, including parent organization and all subsidiaries (if applicable). 11. Indicate whether the FIB/SEM referenced in the response is currently available for ordering from one or more GSA Federal Supply Schedule (FSS) contracts and, if so, provide the GSA FSS contract number(s). 12. Provide any other relevant information that is not listed above which the Government should consider in developing its minimum specifications and finalizing its market research. NIST encourages responses from all responsible sources, including but not limited to small businesses. All responsible sources are encouraged to respond to this notice; however, sources that do not respond shall not be precluded from responding to any subsequent solicitation. Responses to this notice shall be sent by email to Eduardo F. Baca, Support Contractor, at eduardo.baca@nist.gov, with cc: to Joseph Widdup at Joseph.widdup@nist.gov, so that it is received at that email address no later than December 8, 2009. The responses should include responses to the 12 questions listed above. Contracting Office Address: 100 Bureau Drive, Gaithersburg, Maryland 20899-1640 Primary Point of Contact: Eduardo Baca Contractor Senior Acquisition Specialist eduardo.baca@nist.gov Phone: 301-975-6388 Secondary Point of Contact: Joseph Widdup, Contracting Officer joseph.widdup@nist.gov Phone: 301-975-6324
- Web Link
-
FBO.gov Permalink
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- Record
- SN02011221-W 20091126/091125000105-453994f71286fb562215fcd42f1a2f41 (fbodaily.com)
- Source
-
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