SOURCES SOUGHT
66 -- RECOVERY: Ultra-high Resolution Scanning Electron Microscopes (SEMs) and Focused Ion Beam System
- Notice Date
- 11/24/2009
- Notice Type
- Sources Sought
- NAICS
- 334516
— Analytical Laboratory Instrument Manufacturing
- Contracting Office
- Department of Commerce, National Institute of Standards and Technology (NIST), Acquisition Management Division, 100 Bureau Drive, Building 301, Room B129, Mail Stop 1640, Gaithersburg, Maryland, 20899-1640
- ZIP Code
- 20899-1640
- Solicitation Number
- SS-10-SS10
- Archive Date
- 12/16/2009
- Point of Contact
- Kim S Stavish, Phone: 301-975-2672, Patrick K Staines, Phone: (301)975-6335
- E-Mail Address
-
kim.stavish@nist.gov, patrick.staines@nist.gov
(kim.stavish@nist.gov, patrick.staines@nist.gov)
- Small Business Set-Aside
- N/A
- Description
- RECOVERY: The National Institute of Standards & Technology (NIST) seeks information on commercial vendors that are capable of providing several ultrahigh-resolution instruments based on scanning electron microscopes (SEMs) and focused ion beam (FIB) SEMs capable of accurate imaging, dimensional and compositional characterization, analysis and ion-beam milling of a wide variety of biological and non-biological conductive and non-conductive samples. These instruments must work at the nanometer scale, and in certain working modes shall provide resolution and accuracy at essentially atomic scale, i.e. close to or better than 1 nm even at very low electron landing energies. Due to the required high accuracy and repeatability, combined, dual beam instruments, equipped with high-accuracy (laser interferometer) sample stages are generally thought to be suitable for the tasks NIST has to fulfill. After results of this market research are obtained and analyzed and specifications are developed for a system that can meet NIST's minimum requirements, NIST may conduct a competitive procurement and subsequently award a Purchase Order utilizing FAR Subpart 13.5. If at least two qualified small businesses are identified during this market research stage, then any competitive procurement that resulted would be conducted as a small business set-aside. This contemplated procurement is anticipated to utilize American Reinvestment and Recovery Act funding if it is determined that responsible sources can satisfy the requirement. NIST has a need for a system that would meet the following requirements: Ultra high resolution SEMs and FIB SEMs capable of two-and three-dimensional nano-scale characterization of wide variety of samples. The capability of the microscope must include ultra high resolution (< 1 nm) imaging capability in the 1 keV to 30 keV landing energy range and better than 2 nm resolution at very low landing energy (< 500 eV). The SEMs shall be capable to be the base instruments for multiple analytical detection systems such as energy dispersive x-ray detector (EDS), wavelength dispersive x-ray detector (WDS), scanning transmission electron microscopy detector (STEM), electron backscatter diffraction system (EBSD), Everhart-Thornley detector (ETD), in-lens/through-the-lens detector. For sample preparation and small-scale fabrication purposes they shall be capable of working as a dual-beam instrument. For highly accurate dimensional metrology purposes at least one SEM shall be equipped with sub-100 picometer resolution laser interferometer sample stage with the stage stepping distances at or close to two nanometers. The ion beam imaging and milling capabilities shall include <5 nm resolution; full range of beam energy and current suitable for bulk removal to nano fabrication to surface cleaning; fully integrated user interface for SEM and FIB imaging; TEM sample preparation utilities such as micromanipulator and automated software; gas injection system; and additional imaging detectors such as CDEM detector. NIST is seeking responses from all responsible sources, including large, foreign, and small businesses. Small businesses are defined under the associated NAICS code for this effort, 334516, as those domestic sources having 500 employees or less. Please include your company’s size classification in any response to this notice. Companies that manufacture these types of systems are requested to email a detailed report describing their abilities to kim.stavish@nist.gov no later than the response date for this sources sought notice. The report should include achievable specifications and any other information relevant to your product or capabilities. Also, the following information is requested to be provided as part of the response to this sources sought notice: 1. Name of the company that manufactures the system components for which specifications are provided. 2. Name of company(ies) that are authorized to sell the system components, their addresses, and a point of contact for the company (name, phone number, fax number and email address). 3. Indication of number of days, after receipt of order that is typical for delivery of such systems. 4. Indication of whether each instrument for which specifications are sent to kim.stavishl@nist.gov are currently on one or more GSA Federal Supply Schedule contracts and, if so, the GSA FSS contract number(s). 5. Any other relevant information that is not listed above which the Government should consider in developing its minimum specifications and finalizing its market research.
- Web Link
-
FBO.gov Permalink
(https://www.fbo.gov/spg/DOC/NIST/AcAsD/SS-10-SS10/listing.html)
- Place of Performance
- Address: 100 Bureau Drive, Gaithersburg, Maryland, 20899, United States
- Zip Code: 20899
- Zip Code: 20899
- Record
- SN02010533-W 20091126/091124235156-5c37c23665416fdc7ac060cba9586259 (fbodaily.com)
- Source
-
FedBizOpps Link to This Notice
(may not be valid after Archive Date)
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