SOURCES SOUGHT
66 -- Multi-Spectral Cellular Imaging Capability
- Notice Date
- 7/2/2009
- Notice Type
- Sources Sought
- NAICS
- 334516
— Analytical Laboratory Instrument Manufacturing
- Contracting Office
- Department of Energy, Pacific Northwest National Laboratory - Battelle (DOE Contractor), PNNL Contracts, PO Box 999, Richland, Washington, 99352
- ZIP Code
- 99352
- Solicitation Number
- EMSL-RECOVERY-8
- Archive Date
- 8/5/2009
- Point of Contact
- Jan H Slater, Phone: (360) 681-3642, Susan M Turner, Phone: 509-375-3810
- E-Mail Address
-
jan.slater@pnl.gov, susan.turner@pnl.gov
(jan.slater@pnl.gov, susan.turner@pnl.gov)
- Small Business Set-Aside
- N/A
- Description
- PNNL is interested in purchasing a research grade upright automated fluorescence laser scanning confocal microscope with fully integrated nonlinear two-photon excitation microscopy and FLIM. Microscope Requirements: Fully automated upright fluorescence scanning confocal microscope with fully integrated two-photon microscopy, FLIM and DIC imaging: • Two independent, galvanometric scan mirrors with ultra-short line and frame flyback. • Scanning resolution of at least 4 × 1 up to 6140 × 6140 pixels for multiple channels. • Scanning speed of at least 5 frames/sec for 512 × 512 pixels. • Scanning zoom of at least 0.6x - 40x in steps of 0.1. • Scanning rotation of 360 degrees free rotation in steps of 1 degree. • Scanning field of maximum 20 mm field diagonal. • Pre-adjusted master-pinhole for multi-tracking and short wavelengths (e.g. 405 nm). • Exchangeable main beam splitter with up to 50 combinations of excitation wavelengths and maximal laser light suppression. • XY motorized scanning stage, with xyz marking and finding function and mosaic scanning, with smallest increments of 0.2 μm. • Z drive for fast focusing with minimal increment of 25 nm. • Transmitted light illumination and DIC optics. FLIM: • Ultra-fast time correlated single photon counting (TCSPC) system, including computer/laptop and image software for FLIM. • Data analysis software for FLIM. • High sensitivity detector for TCSPC with at least 30 picosecond time resolution. Excitation: • Laser coupling with polarization preserving single-mode fibers, and simultaneous intensity control and switching time < 5 μs using AOTF. • Direct mounting of at least 6 lasers into the scanhead. • Femtosecond pulsed NIR (Ti:Sa) laser for two photon excitation. • Femtosecond tunable laser (488 nm - 640 nm) for FLIM. • CW/Pulsed laser in the near UV (405nm) for both FLIM and confocal microscopy. • CW lasers in the visible range (458 - 633 nm) for confocal microscopy. • Individually collimated laser lines for precise overlap across all lines. • Fast control over laser lines and individual line intensity using AOTF. • Highly repeatable and constant pixel dwell time for quantitative analysis using FRET and FLIM. Emission: • Simultaneous at least 34 channel multi-spectral data acquisition (390 nm - 750 nm) per scan. • Flexible multi-channel configuration for digital real time binning of multi-spectral data into at least ten user-defined channels with individual width and gain controls. • Sequential high resolution spectral scanning with ~3 nm resolution, using up to 8 laser lines and 10 distinct emission lines simultaneously. • 2 non-descanned detectors for two channel acquisition with two-photon excitation. • 1 non-descanned detector for DIC imaging. Software: • Function for system configuration of all motorized functions, scanning module, lasers, acquisition systems and the microscope, including configuration saving and restoring. • Calibration and testing tools for automatic verification and optimal adjustment of the system. • Acquisition mode selection, including spot, line/spline, frame, z-stack, lambda stack, time series, and all combinations (xyz t). • Online calculation and display of ratio images, averaging and summation. • Simultaneous selection of scanning areas with zoom, offset, and rotation functions. • Scanning of multiple ROIs with irregular shapes, defined also in the z axis. Scanning along a freely defined line. • Localized bleaching of multiple ROIs for FRAP, using different speeds for bleaching and image acquisition, and different laser lines for different ROIs. • Fast change of excitation lines at sequential acquisition of multicolor fluorescence for reduction of signal crosstalk, and online spectral unmixing for simultaneous excitation. • Parallel or sequential acquisition of image stacks with spectral information for each pixel. • Visualization in xy, xz, yz, and 3D reconstruction and animation. Control of brightness, contrast and gamma settings, color selection and drawing functions. • Colocalization and histogram analysis, time series analysis, profile measurements, measurement of lengths, angles, surfaces and intensities. Operating addition, subtraction, multiplication, division, ratio, shift, and filtering. • 3D deconvolution for image restoration based on nearest neighbor, maximum likelihood, or constraint iterative calculations. • FLIM, FRET and FRAP image acquisition and analyses. Accessories: • Infinity corrected objectives optimized for IR nonlinear imaging at 20x, 40x, 60x, and 100x magnifications (oil or water immersed), such as 20x/1.0 W PlanApo UV-VIs-IR. WD 1.9mm (421452-9800-000), LD C-Apo 40x/1.1, WD 0.62mm. (421867-9970-000), W PlanApo 63x/1.0 Vis IR, WD 2.1mm (421480-9900-000), Plan-Apochromat 100x/1.4 Oil DIC M27 WD 0.17mm (420792-9900-000) and their corresponding DIC optics. • 5 multicolor filter sets for simultaneous excitation and emission. • A heated stage with temperature and CO2 control for live cell imaging. • Anti-vibration table for lasers and microscope • Workstation PC with large main and hard disk memory space, ergonomic, high-resolving flat panel display and multi-user capability. Interested firms shall also provide information in the following areas as available: 1) A description of current experience, knowledge and capabilities directly applicable to the performance of the scope identified. 2) Brochures providing descriptions of equipment, maintenance and standard warranty, along with a current published commercial pricelist. This Request for Information (RFI) is part of a market research effort that will best address PNNL's needs. This RFI is issued for information and planning purposes only and does not constitute a solicitation. Battelle does not intend to award a contract on the basis of this RFI, or to otherwise pay for information received in response to this RFI. Please provide your expression of interest to the attention of the points of contact listed below. If you have questions or need additional information, they must also be submitted in writing to the points of contact.
- Web Link
-
FBO.gov Permalink
(https://www.fbo.gov/spg/DOE/PNNL/PN/EMSL-RECOVERY-8/listing.html)
- Record
- SN01864667-W 20090704/090703001109-b2b190390547db9b80c96f33f1e4480d (fbodaily.com)
- Source
-
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