SOURCES SOUGHT
66 -- AMBIENT OR ENVIRONMENTALLY-CONTROLLED ATOMIC FORCE / SCANNING PROBE MICROSCOPE
- Notice Date
- 5/11/2009
- Notice Type
- Synopsis
- NAICS
- 334516
— Analytical Laboratory Instrument Manufacturing
- Contracting Office
- 100 Bureau Drive, Building 301, Room B129, Mail Stop 1640 Gaithersburg MD 20899-1640
- ZIP Code
- 20899-1640
- Solicitation Number
- AMD-09-SS42
- Response Due
- 5/22/2009
- Point of Contact
- Todd D Hill, Phone 301-975-8802
- E-Mail Address
-
todd.hill@nist.gov
- Small Business Set-Aside
- N/A
- Description
- The National Institute of Standards & Technology (NIST) seeks information on commercial vendors that are capable of providing an ambient or environmentally-controlled atomic force / scanning probe microscope for the Center for Nanoscale Science and Technology. It will naturally be employed to investigate a wide range of materials and nanostructures in low-humidity or variable-humidity environments. High-resolution imaging and analysis of surface topography, lateral forces and adhesion will be required. Multiple imaging modes conductive, contact and non-contact, with setpoint modulation capability and the ability to be modified (at the hardware and software levels) for user-defined modes - are also required. After results of this market research are obtained and analyzed and specifications are developed for an atomic force microscope that can meet NIST's minimum requirements, NIST may conduct a competitive procurement and subsequently award a Purchase Order. If at least two qualified small businesses are identified during this market research stage, then any competitive procurement that resulted would be conducted as a small business set-aside. NIST has a need for a stand-alone AFM/SPM that would meet the following requirements: AFM/SPM: This AFM/SPM shall be capable of multiple imaging modes, including force spectroscopy in non-contact and contact modes and force curve mapping. Shall be capable of closed loop scanning. Shall be capable of conductive AFM measurements. Shall be capable of atomic resolution imaging, preferably closed loop for accurate measurements. Shall be capable of supporting at least three electrical leads to the probe. Shall be capable of heating the sample with minimal thermal drift up to 300ΊC. Shall be capable of measuring humidity near the sample. Electronics: Shall be versatile with open schematics (or a strong service/support) record for ease of use and alteration. Shall include access to detected signals with a high detection bandwidth (e.g. 5-10 MHz). Environmental control: Shall be flushable with dry nitrogen or be compatible with a home-built/custom enclosure for atmospheric control. Shall permit operation of the AFM in a dry or humid environment. Shall exhibit high thermal stability (active thermal stabilization is preferred). Specimen holders, tip and sample exchange, and imaging stages: Shall include a top-view camera for alignment and video/snapshot recording. Sample holders shall accommodate 1 cm sample sizes are larger. Microscope control software: Shall be fully integrated and capable of controlling the functions of the microscope and detectors in a user-friendly fashion. Shall consist of IgorPro user-programmable scripts and functions. Data analysis software: Shall include quantitative data analysis software using the most common data analysis algorithms. Shall be user-programmable. AFM atomic force microscope(y) SPM scanning probe microscope(y) NIST is seeking responses from all responsible sources, including large, foreign, and small businesses. Small businesses are defined under the associated NAICS code for this effort, 334516, as those domestic sources having 500 employees or less. Please include your companys size classification in any response to this notice. Companies that manufacture analytical atomic force microscopes are requested to email a detailed report describing their abilities to todd.hill@nist.gov no later than the response date for this sources sought notice. The report should include achievable specifications and any other information relevant to your product or capabilities. Also, the following information is requested to be provided as part of the response to this sources sought notice: 1. Name of the company that manufactures the system components for which specifications are provided. 2. Name of company(ies) that are authorized to sell the system components, their addresses, and a point of contact for the company (name, phone number, fax number and email address). 3. Indication of number of days, after receipt of order that is typical for delivery of such systems. 4. Indication of whether each instrument for which specifications are sent to todd.hill@nist.gov are currently on one or more GSA Federal Supply Schedule contracts and, if so, the GSA FSS contract number(s). 5. Any other relevant information that is not listed above which the Government should consider in developing its minimum specifications and finalizing its market research. NOTE: THIS NOTICE WAS NOT POSTED TO FEDBIZOPPS ON THE DATE INDICATED IN THE NOTICE ITSELF (11-MAY-2009); HOWEVER, IT DID APPEAR IN THE FEDBIZOPPS FTP FEED ON THIS DATE. PLEASE CONTACT 877-472-3779 or fbo.support@gsa.gov REGARDING THIS ISSUE.
- Web Link
-
Link To Document
(https://www.fbo.gov/spg/DOC/NIST/AcAsD/AMD-09-SS42/listing.html)
- Place of Performance
- Address: NIST Gaithersburg, MD
- Zip Code: 20899
- Country: US
- Zip Code: 20899
- Record
- SN01813888-F 20090513/090511233022 (fbodaily.com)
- Source
-
FedBizOpps Link to This Notice
(may not be valid after Archive Date)
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