SOURCES SOUGHT
66 -- LOW-TEMPERATURE UHV AFM/STM
- Notice Date
- 4/6/2009
- Notice Type
- Sources Sought
- NAICS
- 334516
— Analytical Laboratory Instrument Manufacturing
- Contracting Office
- Department of Commerce, National Institute of Standards and Technology (NIST), Acquisition Management Division, 100 Bureau Drive, Building 301, Room B129, Mail Stop 1640, Gaithersburg, Maryland, 20899-1640
- ZIP Code
- 20899-1640
- Solicitation Number
- AMD-09-SS34
- Archive Date
- 5/6/2009
- Point of Contact
- Todd D Hill, Phone: 301-975-8802
- E-Mail Address
-
todd.hill@nist.gov
- Small Business Set-Aside
- N/A
- Description
- The National Institute of Standards & Technology (NIST) seeks information on commercial vendors that are capable of providing a variable low-temperature ultra-high vacuum atomic force microscope for the Center for Nanoscale Science and Technology. It will naturally be employed to investigate a wide range of materials and nanostructures at variable temperatures ranging from liquid helium up to room temperature or higher. High-resolution imaging and analysis of surface topography, lateral forces and adhesion will be needed. Multiple imaging modes – contact, non-contact, setpoint modulation, and scanning tunneling capabilities - are also required. After results of this market research are obtained and analyzed and specifications are developed for an electron microscope that can meet NIST's minimum requirements, NIST may conduct a competitive procurement and subsequently award a Purchase Order. If at least two qualified small businesses are identified during this market research stage, then any competitive procurement that resulted would be conducted as a small business set-aside. NIST has a need for a VT/LT-AFM that would meet the following requirements: AFM: •This AFM shall be capable of multiple imaging modes, including force spectroscopy in non-contact and contact modes. •Shall be capable of atomic resolution imaging at variable temperatures. •Shall be capable of supporting at least four electrical leads to the probe. Electronics: •Shall be versatile with open schematics for ease of use and alteration. Vacuum system: •Shall produce a clean vacuum that minimizes contamination. •Shall permit operation of the AFM in a UHV environment. •Shall have additional flanges to permit the addition of surface analysis equipment. Temperature variability: •Shall be capable of stable imaging at temperatures ranging from LHE to room temperature. •Shall permit sample heating and annealing of up to 1000C. Specimen holders, tip and sample exchange, and imaging stages: •Shall include in situ transfer of samples and probe tips. •Sample holders shall permit in situ surface deposition and surface treatment. Microscope control software: •Shall be fully integrated and capable of controlling the functions of the microscope and detectors in a user-friendly fashion. Data analysis software: •Shall include quantitative data analysis software using the most common data analysis algorithms AFM – atomic force microscope(y) STM – scanning tunneling microscope(y) VT – variable temperature LT – low-temperature UHV – ultra-high vacuum LHE – liquid helium NIST is seeking responses from all responsible sources, including large, foreign, and small businesses. Small businesses are defined under the associated NAICS code for this effort, 334516, as those domestic sources having 500 employees or less. Please include your company’s size classification in any response to this notice. Companies that manufacture analytical atomic force microscopes are requested to email a detailed report describing their abilities to todd.hill@nist.gov no later than the response date for this sources sought notice. The report should include achievable specifications and any other information relevant to your product or capabilities. Also, the following information is requested to be provided as part of the response to this sources sought notice: 1. Name of the company that manufactures the system components for which specifications are provided. 2. Name of company(ies) that are authorized to sell the system components, their addresses, and a point of contact for the company (name, phone number, fax number and email address). 3. Indication of number of days, after receipt of order that is typical for delivery of such systems. 4. Indication of whether each instrument for which specifications are sent to todd.hill@nist.gov are currently on one or more GSA Federal Supply Schedule contracts and, if so, the GSA FSS contract number(s). 5. Any other relevant information that is not listed above which the Government should consider in developing its minimum specifications and finalizing its market research.
- Web Link
-
FedBizOpps Complete View
(https://www.fbo.gov/?s=opportunity&mode=form&id=3a1350f83c13f8b1ac006fb475552a60&tab=core&_cview=1)
- Place of Performance
- Address: NIST, Gaithersburg, Maryland, 20899, United States
- Zip Code: 20899
- Zip Code: 20899
- Record
- SN01786826-W 20090408/090406221000-3a1350f83c13f8b1ac006fb475552a60 (fbodaily.com)
- Source
-
FedBizOpps Link to This Notice
(may not be valid after Archive Date)
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