SOURCES SOUGHT
66 -- ANALYTICAL TRANSMISSION ELECTRON MICROSCOPE
- Notice Date
- 4/6/2009
- Notice Type
- Sources Sought
- NAICS
- 334516
— Analytical Laboratory Instrument Manufacturing
- Contracting Office
- Department of Commerce, National Institute of Standards and Technology (NIST), Acquisition Management Division, 100 Bureau Drive, Building 301, Room B129, Mail Stop 1640, Gaithersburg, Maryland, 20899-1640
- ZIP Code
- 20899-1640
- Solicitation Number
- AMD_09_SS35
- Archive Date
- 5/6/2009
- Point of Contact
- Todd D Hill, Phone: 301-975-8802
- E-Mail Address
-
todd.hill@nist.gov
- Small Business Set-Aside
- N/A
- Description
- The National Institute of Standards & Technology (NIST) seeks information on commercial vendors that are capable of providing a high resolution, high performance, analytical, environmental transmission electron microscope to support a research program in the Center for Nanoscale Science and Technology. It will naturally be employed to investigate a wide range of materials and nanostructures, including organic and inorganic and hybrid structures, but the primary emphasis will be on experiments involving imaging and analysis of samples at high temperatures in a variety of controlled, relatively high pressure gaseous environments. High-resolution imaging (including energy-filtered imaging) and analysis (including XEDS and EELS element-specific mapping) in TEM and STEM modes will be needed. Multiple diffraction modes - selective area, nano-beam and convergent-beam - are also required. After results of this market research are obtained and analyzed and specifications are developed for an electron microscope that can meet NIST's minimum requirements, NIST may conduct a competitive procurement and subsequently award a Purchase Order. If at least two qualified small businesses are identified during this market research stage, then any competitive procurement that resulted would be conducted as a small business set-aside. NIST has a need for an analytical transmission electron microscope that would meet the following requirements: Environmental capabilities: •The pressure at the sample shall be at least 10 Torr, while the rest of the instrument is maintained at a good operating vacuum. •It should be a TEM/STEM with 5-7 mm pole-piece gap to accommodate specialized in situ holders and to facilitate tomography Electron gun: •The gun shall produce a high-brightness, low energy-spread beam suitable for imaging and analysis of nanostructures. •The maximum operating voltage should be 200 kV – 300 kV, with the ability to operate at voltages as low as 80 kV. Electron optics •Shall be capable of switching between TEM, STEM and CBED modes and producing illumination suitable for both XEDS and HRTEM •In STEM mode the microscope shall be capable of resolution of at least 0.14 nm and shall be capable of delivering at least 1 nA in a probe less than or equal to 0.2 nm. Objective lens/Projection system: •Shall be capable of delivering a point-to-point resolution of 0.24 nm, with an information limit of 0.14 nm. Image acquisition: •Shall have both a HRTEM camera and a large area of view TV camera. Detectors: •HAADF detector located at the entrance to the energy filter, with an angular range of at least 70 mrad •Imaging electron energy filter which, combined with the rest of the electron optics, shall have an energy resolution of < 1 eV. •X-ray energy dispersive analysis detector Goniometer and specimen stages: •Shall include single and double tilt stages having stability suitable for high-resolution imaging. Vacuum system: •Shall produce a clean vacuum that minimizes contamination Microscope control software: •Shall be fully integrated and capable of controlling the functions of the microscope and detectors in a user-friendly fashion. Data analysis software: •Shall include quantitative data analysis software using the most common data analysis algorithms TEM – transmission electron microscope/microscopy STEM – scanning transmission electron microscope/microscopy CBED – convergent electron beam diffraction HRTEM – high resolution electron microscope/microscopy HAADF – high-angle annular dark-field XEDS – x-ray energy dispersive spectroscopy NIST is seeking responses from all responsible sources, including large, foreign, and small businesses. Small businesses are defined under the associated NAICS code for this effort, 334516, as those domestic sources having 500 employees or less. Please include your company’s size classification in any response to this notice. Companies that manufacture analytical transmission electron microscopes are requested to email a detailed report describing their abilities to todd.hill@nist.gov no later than the response date for this sources sought notice. The report should include achievable specifications and any other information relevant to your product or capabilities. Also, the following information is requested to be provided as part of the response to this sources sought notice: 1. Name of the company that manufactures the system components for which specifications are provided. 2. Name of company(ies) that are authorized to sell the system components, their addresses, and a point of contact for the company (name, phone number, fax number and email address). 3. Indication of number of days, after receipt of order that is typical for delivery of such systems. 4. Indication of whether each instrument for which specifications are sent to todd.hill@nist.gov are currently on one or more GSA Federal Supply Schedule contracts and, if so, the GSA FSS contract number(s). 5. Any other relevant information that is not listed above which the Government should consider in developing its minimum specifications and finalizing its market research.
- Web Link
-
FedBizOpps Complete View
(https://www.fbo.gov/?s=opportunity&mode=form&id=904b75eb41fc7b070d9ab5fa910c552b&tab=core&_cview=1)
- Place of Performance
- Address: NIST, Gaithersburg, Maryland, 20899, United States
- Zip Code: 20899
- Zip Code: 20899
- Record
- SN01786753-W 20090408/090406220834-904b75eb41fc7b070d9ab5fa910c552b (fbodaily.com)
- Source
-
FedBizOpps Link to This Notice
(may not be valid after Archive Date)
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