SOLICITATION NOTICE
66 -- PORTABLE ARM COORDINATE MEASURING MACHINE
- Notice Date
- 8/31/2007
- Notice Type
- Solicitation Notice
- NAICS
- 334519
— Other Measuring and Controlling Device Manufacturing
- Contracting Office
- NASA/George C. Marshall Space Flight Center, Procurement Office, Marshall Space Flight Center, AL 35812
- ZIP Code
- 35812
- Solicitation Number
- NNM07211142Q
- Response Due
- 9/12/2007
- Archive Date
- 8/31/2008
- Small Business Set-Aside
- N/A
- Description
- NASA/MSFC has a requirement for quantity one (1) Portable Arm Coordinate Measuring Machine. The salient characteristics are as follows: Minimum Government Specifications This requirement is for a portable arm coordinate measuring machine (PA-CMM) with seven degrees of freedom equipped with contact and non-contact measuring probes and covering a spherical measuring volume of eight feet diameter. The PA-CMM will be used primarily for a general purpose metrology tool to replace surface plate gages, slide calipers, and depth micrometers for assembly and disassembly dimensional measurements of precision bearing and seal test rigs. The instrument shall provide discrete X, Y, and Z measured coordinates and provide for calculated linear dimensions and size of geometric features. Since much of the hardware to be measured will have been cleaned for use in liquid oxygen, the PA-CMM must be a ?clean? instrument and suitable for use in a 100k class clean room. The seven degrees of freedom will allow for maximum flexibility in positioning the measuring probe for length measurement in three dimensional space. Contact and non-contact measuring probes will allow for length measurement of conventional rigid machined surfaces and delicate surfaces. The contact probes will allow for rigid contact and ?touch-trigger? soft contact gaging. The non-contact probe will use reflected light or a laser and allow for a continuous scan to record the three dimensional profile of a surface. The measured data shall be human readable in real time with the provision for storage and analysis after measurement by means of a PC type laptop computer with instrument specific software running under Windows Operating System. Operating and analysis software will allow for comparison of measured features to computer aided design (CAD) data and also for reverse engineering by producing CAD data from a measured surface. Minimum Specifications: Measuring Volume: 8 foot spherical diameter. Freedom of movement: The PA-CMM shall have a seven axis degree of freedom with 360 degree rotation around the primary axes. Gage Probe: The PA-CMM shall be able to measure a variety of samples of varying rigidity and as such should be able to make hard contact, soft contact (touch probe), and non contact measurements. Gage Probe Extensions: The PA-CMM shall include an accessory kit of various probe geometries and extensions up to 10 inches to allow measurement in a 0.75 inch bore. Portability: The PA-CMM shall be portable and provided with protective transportation cases such that one person could unpack, assemble, verify calibration, and make measurements in less than 30 minutes. Cleanliness: The PA-CMM will often be used in a 100k class clean room for assembly of turbomachinery hardware that has been cleaned for liquid oxygen service. As such, any part of the instrument that may come in contact with the part to be measured, must withstand cleaning with solvent based fluids such as isopropyl alcohol, denatured alcohol, hydrofluoroethers, and perfluorinated cleaning solvents. Also, as many of the intended parts to be measured will be used for liquid oxygen service and will not be able to be cleaned after measuring, no aerosol films or surface adhering reflective agents that are not compatible with oxygen service shall be used to improve the quality of a three dimensional surface scan. Sealed joints: The PA-CMM shall have sealed joints such that no lubricants or internal fluids could leak and contaminate parts to be measured for oxygen service. Accuracy: Contact Probe: Total measuring error shall not exceed 0.0016 inches at maximum extension. Non Contact, scanning probe: Total system measuring error not to exceed 0.0035 inches at maximum extension. Calibration: A physical standard shall be supplied to verify system measuring accuracy and to allow for ?sanity checks? and calibration of custom configured probe tips. The standard shall be NIST traceable. Temperature: The instrument will be used in a variety of production floor environments and shall be dimensionally stable within its stated accuracy in an operating range of 50 F to 100 F with a temperature drift of up to 5 degrees F per hour either through inherent material selection or active temperature compensation. Analysis Software: Must be able to import/export to common CAD system file formats such as SolidWorks, AutoCAD or standards such as IGES. Must be able to display current X,Y, and Z coordinate position of probe contact and display calculated geometric dimensions of multiple measurements a from graphical user interface. Must be able to display the three dimensional representation of the surface from discrete contact measurements and a surface cloud of the measured surface from the non contact, surface scanning mode. Must be able to display in and out of tolerance areas of measured data with respect to design or CAD data. Instrument Mounting: The mounting accessories shall include a vacuum base, a magnetic base, and one that can be clamped or bolted by the user to a fixed structure. These can be individual bases or a combined function base. The instrument shall also provide a suitably rigid, folding tripod for a portable mount for the above bases. Data Point Measurement: Contact: For the contact mode the instrument shall record data points in at least two modes: a single point trigger mode and scanning mode where multiple points are continuously taken while a trigger is depressed. Non Contact: The instrument shall continuously record data points and display them real time on a display monitor in a surface cloud format. The scanning mode shall knit together successive overlapping scans to indicate when full coverage of the measured part is obtained. Non contact standoff: Minimum 3 inch standoff, or working distance from the surface being measured. Non-contact scan width: Minimum of 0.75 inch per pass. Counterbalancing: The measuring arm and all attached accessories shall be balanced to require less than a 5 pound lifting force at the probe handle when fully extended. Overload protection (torque and bending moment): The instrument shall be able to compensate for arm deflections due to torque and bending moments under the instrument?s own weight over the entire range of motion and provide a warning when excessive torque and bending is being applied. On Site Training: Minimum of two days for three people; to include instrument assembly/disassembly, sample measurements, and analysis software operation. Electrical power: 120 VAC/60 Hz with cordless, rechargeable battery operation capability with minimum three hour run time. This notice is a combined synopsis/solicitation for commercial items prepared in accordance with the format in FAR Subpart 12.6, as supplemented with additional information included in this notice. This announcement constitutes the only solicitation, which is issued as a Request for Quotation (RFQ); quotes are being requested and a written solicitation will not be issued. Offerors are required to use the On-Line RFQ system to submit their quote. The On-line RFQ system is linked above or it may be accessed at http://prod.nais.nasa.gov/cgi-bin/eps/bizops.cgi?gr=C&pin= . The information required by FAR Subpart 12.6 is included in the on-line RFQ. The Government intends to acquire a commercial item using FAR Part 12 and the Simplified Acquisition Procedures set forth in FAR Part 13. Questions regarding this acquisition must be submitted in writing by email no later than 09/07/07. It is the quoter's responsibility to monitor this site for the release of amendments (if any). Potential quoters will be responsible for downloading their own copy of this notice, the on-line RFQ and amendments (if any). An ombudsman has been appointed - See NASA Specific Note "B". Any referenced notes may be viewed at the following URLs link below.
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