MODIFICATION
66 -- Electrical and Electrical Properties Measurement and Testing Instrument
- Notice Date
- 6/30/2006
- Notice Type
- Modification
- Contracting Office
- N00178 17320 Dahlgren Road Dahlgren, VA
- ZIP Code
- 00000
- Solicitation Number
- N0017806R3047
- Response Due
- 7/12/2006
- Archive Date
- 9/1/2006
- Point of Contact
- XDS13-3 540-653-7039 XDS13-3 540-653-7765
- Description
- This synopsis is modified to answer the following questions: Question Number 1: Item 4: Z range - it is not indicated if this is for scanning or lift mode. Would a smaller Z range be acceptable? Answer Number 1: The Z (vertical axis range must be at least 15 micrometers (only 15 micrometers and above will be considered as responsive) in the image acquisition ?image scanning? mode with a system noise less than 1 angstrom root mean square (RMS). Question Number 2: There are no requirements given for the inverted optical microscope. Number of lenses, condensers N.A, what kind of stage for optical work, any additional image capabilities for the optical scope, i. Bright field, ii. Confocal, iii. Fluorescence, iv. DIC. Answer Number 2: Optical Microscope ? item 5 is changed to state that the system must include an inverted optical microscope base equivalent to an Olympus IX series inverted microscope capable of doing confocal image acquisition as a host to the scanning probe microscope. Question Number 3: It is not indicated if the motorized stage is for the AFM stage or the optical stage. Answer Number 3: The system must have a motorized positioning feature capable of positioning the tip probe of the scanning probe microprobe over the area to be imaged/manipulated with a precision of 10 micrometers or less anywhere in an area with dimensions of 8 millimeter x 8 millimeter or larger. The closing date is extended to 11:00 a.m. EST on 12 July 2006.
- Record
- SN01081520-W 20060702/060630221339 (fbodaily.com)
- Source
-
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