Loren Data's SAM Daily™

FBO DAILY ISSUE OF JUNE 15, 2005 FBO #1297
MODIFICATION

66 -- Cold Field Emission Gun Scanning Transmission Electron Microscope

Notice Date

6/13/2005
 

Notice Type

Modification
 

NAICS

339111 — Laboratory Apparatus and Furniture Manufacturing
 

Contracting Office

Department of Energy, Brookhaven National Laboratory (DOE Contractor), Brookhaven, PO Box 5000 Bldg. No. 355, Upton, NY, 11973
 

ZIP Code

11973
 

Solicitation Number

CFEGSTEMRFP98078
 

Response Due

7/15/2005
 

Archive Date

7/30/2005
 

Description

This is a combined synopsis/solicitation. This solicitation is being issued as a Request for Proposals (RFP) for a 200 kV cold field-emission gun (CFEG) aberration corrected high-resolution and analytical Scanning Transmission Electron Microscope (STEM). Under this RFP Brookhaven Science Associates operator of the Department of Energy?s Brookhaven National Laboratory will award a firm fixed price contract for a Scanning Transmission Electron Microscope. The electron microscope shall be a dedicated scanning transmission high-resolution instrument with EELS and diffraction capabilities. It shall offer the possibility of combined usage of atomic-imaging resolution imaging, high energy-resolution spectroscopy, specimen cooling and heating. The performance of the microscope shall meet the published specifications of the manufacturer, including but not limited to the salient features specified in the solicitation. This specification describes the requirements for an aberration corrected 200 kV Cold Field Emission Gun Scanning Transmission Electron Microscope (CFEGSTEM) designed to provide an optimum combination of capabilities for high-resolution imaging, electron energy-loss spectroscopy (EELS), and nano-diffraction. A parallel electron energy-loss spectrometer (PEELS) shall be provided. A high-angle annular dark-field (HAADF), a medium angle annular dark field (MAADF) and a bright field (BF) detector are also required, in addition to a multi-scan CCD camera for detecting diffraction patterns and Ronchigrams. In additional to the manufacturer?s specification for a state-of-the-art STEM, the instrument shall also be designed to meet BNL?s special requirements delineated in the solicitation. This acquisition is planned as a ?Best Value? procurement. The utilization of this procedure is expected to provide the greatest overall benefit to BSA/BNL. ?Best Value? employs a trade off process that permits award to other than the lowest priced offeror or to the highest technically rated offeror. The tradeoff process, associated with Best Value involves a comparative weighing of the evaluation factors and sub-factors identified in the Request for Proposals (RFP). Specifically, the trade off process involves selecting the most advantageous offer based upon an integrated assessment of both non-cost/price factors, taken in their assigned relative importance. The following factors, in their relative order of weighting, will be utilized to evaluate the offers: - General Technical Specifications: Submit operating specifications for the proposed STEM system utilizing the same format (Section and Sub-Section numbering) presented by the specifications contained in the solicitation. - Upgradeability: Submit operating specifications and availability of or demonstrate the ability to design and manufacture the following components: Electron gun monochromator; Environmental Chamber, as detailed in Section 6 of the specifications. - Performance Risk: Submit references, points of contact and telephone numbers for all installations of STEM or similar systems for the last 3 years. - Specialized Technical Specifications: demonstrate, for the operating parameters listed, those, which tangibly exceed the base requirement contained in the specification and thereby provide improved operating capabilities. Section 2.3.2 Beam Current in the 2 ? probe Section 2.3.2; Energy Resolution Small Collection Angle; Section 2.5.1 Probe Size; Section 2.7.7 Stage Drift. Proposals are due July 15, 2005, by 4:00 PM, EDT, and shall be submitted to Brookhaven Science Associates, Brookhaven National Laboratory, Attention: D. Paveglio, Bldg. 355, Upton, NY 11973, by US mail This RFP has been sent to the following known manufacturers: Nion Co., 1102 8th St., Kirkland, WA 98033 Hitachi Electron Microscope Division, 940 Clopper Road, Suite 44, Gaithersburg, MD 20878 Jeol USA, Inc.11 Dearborn Road, Peabody, MA 01960 FEI Company, 257 Loring Avenue, Salem, MA 01970 Carl Zeiss, One Zeiss Drive, Thornwood, NY 10594
 

Place of Performance

Address: Brookhaven National Laboratory,, Upton, NY

Zip Code: 11973-5000

Country: USA
 

Record

SN00828558-W 20050615/050613211632 (fbodaily.com)
 

Source

FedBizOpps.gov Link to This Notice
(may not be valid after Archive Date)

---

| FSG Index  |  This Issue's Index  |  Today's FBO Daily Index Page |