Loren Data's SAM Daily™

FBO DAILY ISSUE OF AUGUST 28, 2003 FBO #0637
SOLICITATION NOTICE

66 -- NanoScope IV SPM Microscope

Notice Date

8/26/2003
 

Notice Type

Solicitation Notice
 

Contracting Office

Department of Health and Human Services, National Institutes of Health, Nat'l Institute of Diabetes, Digestive, & Kidney Diseases, 2 Democracy Plaza, Suite 700W 6707 Democracy Blvd., MSC 5455, Bethesda, MD, 20892-5455
 

ZIP Code

20892-5455
 

Solicitation Number

NIH-NIDDK-
 

Response Due

9/9/2003
 

Archive Date

9/24/2003
 

Point of Contact

Patricia Haun, Purchasing Agent, Phone (301) 594-8855, Fax (301) 480-4226,
 

E-Mail Address

haunp@extra.niddk.nih.gov
 

Description

This is a combined synopsis/solicitation for commercial items prepared in accordance with the format in FAR 12.6 as supplemented with additional information included in this notice. This announcement constitutes the only solicitation and a separate written solicitation will not be issued. This solicitation number is NIH-NIDDK-03-996, and is issued as a Request for Quotation (RFQ). The solicitation/contract will include all applicable provisions and clauses in effect through Federal Acquisition Circular 2001-14. The North American Industry Classification (NAICS) Code is 339111 and the business size standard is 500 Employees. However, this solicitation is not set aside for small business. This acquisition is being conducted using Simplified Acquisition Procedures in accordance with FAR Part 13. The National Institutes of Health (NIH), National Institute of Diabetes and Digestive and Kidney Diseases (NIDDK), has a requirement for a NanoScope IV SPM Control Station, NanoScope Software & Computer, NanoScope MultiMode Atomic Force Microscope, 10 Micron AFM Scanner with Vertical Engage for MMAFM, AFM, and LFM, Cantilever Holder for Scanning in Fluid, Video-only Microscope System (100v/120v), Installation, Training and Shipping/Handling from Veeco Metrology LLC, 112 Robin Hill Road, Santa Barbara, CA 93117. This notice of intent is not a request for competitive quotations however, all responses received, within 15 days from the date of publication of this synopsis will be considered by the Government. A determination by the Government not to compete this proposed acquisition is based upon responses to this notice and is solely for the purpose of determining whether to conduct a competitive acquisition. The Atomic Force Microscopy (AFM) system shall meet the following specifications: 1) A wide variety of imaging modalities shall be possible, including contact-mode topographical imaging, non-contact-mode imaging achieved by mechanical excitation of AFM tip oscillation and lock-in detection, imaging of the phase of tip oscillations relative to the phase of mechanical excitation, imaging of surface electrostatic potential by feedback adjustment of the tip-to-surface dc voltage difference to minimize tip oscillations under ac voltage excitation, and lateral force imaging. It shall be possible to perform these imaging modalities both in air and in an aqueous fluid environment. 2) Imaging resolution in the vertical direction in air must be better than 0.5 angstroms for a 1 micron scan size, as limited by mechanical noise. It shall be possible to obtain images over 10 micron square image fields with the included piezoelectric scanner. Scanners capable of imaging over 100 micron square fields. 3) The linearity of images in the lateral dimensions shall be better than 2% after real-time correction for piezoelectric nonlinearities. 4) The AFM shall have a design in which the scanning in the vertical and lateral directions is achieved by translation of the sample, rather than by translation of the AFM tip, in order to obtain the greatest possible stability and resolution. 5) It shall be possible to obtain images with up to 4 megapixel data sizes, with up to 16 kilopixels in a single scan line. 6) It shall be possible to exchange fluids within the sample fluid cell without removing the sample from the AFM stage and without manual retraction and manual approach of the scanning tip from the sample. The sample fluid cell shall include an o-ring seal to minimize fluid evaporation in the course of experiments. 7) An optical microscope for visualization of the sample surface and the approach of the AFM tip to the surface shall be included. The optical microscope shall include a color CCD camera and color display monitor. 8) The AFM controller shall include dual quadrature lock-in amplifiers for phase imaging over the entire phase range. Lock-in amplifiers shall operate up to 2 megahertz, with variable bandwidth from 100 Hz to 15 kHz under software control. 9) The AFM system and controller shall permit the use of microactuated probes with integrated piezoelectric elements for rapid contact-mode and non-contact mode scanning in air. The controller shall be capable of sampling rates in excess of 50 kHz. 10) The AFM controller shall be capable of ?Q control? operation, meaning that the driving voltage for tip excitation shall be controlled automatically to produce a dependence of tip oscillation amplitude on driving frequency that is either broader or sharper than the natural dependence. The effective Q and center frequency shall be under software control. 11) The AFM controller hardware and software shall permit interleaved acquisition of non-contact topographic and surface potential (electrostatic) images, with the surface potential image being acquired with a constant vertical offset between the tip and the surface topography. This offset shall be under software control. 12) The AFM controller shall include at least two auxiliary analog-to digital converter inputs for digitization and storage of external signals in synchrony with the acquisition of AFM images. The controller shall include TTL signal outputs to synchronize external devices with the end of image scans and line scans. The controller shall include a lock-in reference signal output. 13) The AFM system shall include Pentium 4 or better computer with minimum 50 gigabyte hard disk and minimum 512 megabyte RAM memory for control of experiments and data storage. All software for experiment control and image analysis shall be included. The computer system shall include dual 18 inch LCD monitors for simultaneous display of experimental control parameters and AFM images. 14) The AFM system shall include 50 probes, including 10 etched silicon probes, 20 silicon nitride probes, 10 oxide-sharpened silicon nitride probes, and 10 microactuated silicon probes. 15) Installation, on-site training and full on-site performance verification shall be included. The offeror must include a completed copy of the provision of FAR Clause 52.212-3, Offeror Representations and Certifications ? Commercial Items with its offer. The provisions of FAR Clause 52.212-4, Contract Terms and Conditions ? Commercial Items, applies to this acquisition. The addenda to the clause reads as follows: The offeror must include in their quotation, the unit price, the list price, shipping and handling costs, the delivery period after contract award, the prompt payment discount terms, the F.O.B. Point (Destination or Origin), the Dun & Bradstreet Number (DUNS), the Taxpayer Identification Number (TIN), and the certification of business size. The FAR Clause 52.212-5, Contract Terms and Conditions Required to Implement Statutes or Executive Orders ? Commercial Items ? Deviation for Simplified Acquisitions, applies to this acquisition. The clauses are available in full text at http://www.arnet.gov/far. Interested vendors capable of furnishing the government with the item specified in this synopsis should submit their quotation to the below address. Quotations will be due fifteen (15) calendar days from the publication date of this synopsis or September 9, 2003. The quotation must reference ?Solicitation number? NIH-NIDDK-03-996. All responsible sources may submit a quotation, which if timely received, shall be considered by the agency. Quotations must be submitted in writing to the National Institute of Diabetes and Digestive and Kidney Diseases 6707 Democracy Blvd., Room 774C, Bethesda, Maryland 20817, Attention: Patricia Haun. Faxed copies will not be accepted.
 

Place of Performance

Address: 9000 Rockville Pike, Bethesda, MD

Zip Code: 20892

Country: USA
 

Record

SN00412491-W 20030828/030827074259 (fbodaily.com)
 

Source

FedBizOpps.gov Link to This Notice
(may not be valid after Archive Date)

---

| FSG Index  |  This Issue's Index  |  Today's FBO Daily Index Page |