SOURCES SOUGHT
66 -- Dynamic Circuit Card Analyzer Test System
- Notice Date
- 6/11/2003
- Notice Type
- Sources Sought
- Contracting Office
- Department of the Navy, Naval Air Systems Command, Naval Air Warfare Center Aircraft Division Lakehurst, Contracts Department Hwy. 547 Attn:B562-1, Lakehurst, NJ, 08733-5083
- ZIP Code
- 08733-5083
- Solicitation Number
- N68335-03-R-0104
- Response Due
- 7/23/2003
- Archive Date
- 8/7/2003
- Point of Contact
- Dianne Mount, Contract Specialist, Phone 732-323-2903, Fax 732-323-7440,
- E-Mail Address
-
mountdm@navair.navy.mil
- Description
- The Naval Air Warfare Center Aircraft Division intends to issue a Request for Proposal for a Dynamic Circuit Card Analyzer Test System (DCCATS) during the fourth quarter of fiscal year 2004 with a contract award planned for the first quarter of fiscal year 2005. The DCCATS is intended for use at the Intermediate Maintenance Level (I-Level) and will enhance the Fleet technician's ability to provide cost effective maintenance of electronic Circuit Card Assemblies (CCAs) and subassemblies, by integrating multi-functional testing of components with Analog Signature Analysis (ASA). Currently, testing of CCAs is accomplished through either functional board testing or ASA. Functional board testing is typically accomplished at the I-Level utilizing Automated Test Equipment (ATE) such as Consolidated Automated Support System (CASS) and a Test Program Set (TPS). In-circuit component testing is typically accomplished at the I-Level utilizing Analog Signature Analysis (ASA) such as the Huntron 5100DS with a Gold Disk and General Purpose Electronic Test Equipment (GPETE). The new DCCATS will functionally test each component, resulting in more accurate fault isolation than presently realized using ASA only. Although the DCCATS will not functionally test the entire board as with CASS, development time and costs are expected to be considerably lower than with traditional ATE TPSs. With the advent of advanced technology providing more reliable fault detection and isolation (component functional testing), it would appear cost beneficial to integrate this technology into the Level of Repair (LOR) philosophy. NAVAIR is currently developing the DCCATS performance specification and is seeking information on available and emerging Commercial Off-The-Shelf (COTS) or Non-Developmental Item (NDI) technologies and products that will satisfy DCCATS performance requirements. Industry may provide any information (specifications, brochures, etc) on current or emerging products that shall satisfy DCCATS performance requirements to the following: Naval Air Warfare Center Aircraft Division Lakehurst Attn: Ms. Dianne Mount, Code 25222DM, B562-1 Highway 547 Lakehurst NJ 08733 The Government will not pay for any information received in response to this RFI nor will the Government compensate any respondent for any costs incurred in developing the information provided to the Government. Additionally, the Government will host an Industry Day on July 30, 2003 at Lakehurst NJ. The purpose of industry day is to provide potential offerors a face-to-face opportunity to apprise NAVAIR of their products and to provide input into the DCCATS performance specification. During DCCATS Industry Day, NAVAIR will provide a brief overview of our requirements and current acquisition plans followed by a series of one-on-one meetings with individual firms (50 minute maximum for each firm). These individual meetings will allow an opportunity for industry to provide additional information on their products and to comment and/or ask questions regarding the draft DCCATS performance specification as well as to demonstrate their products to NAVAIR. Companies desiring to participate in Industry Day should fax their request to the contracting office: Ms. Dianne Mount at 732-323-2359 or email to Dianne.mount@navy.mil. Written requests are required but questions may be directed to Ms. Mount at 732-323-2903. Appointments for individual sessions will be assigned on a first come-first served basis. If necessary, meetings may also be scheduled for the following day, July 31. Any electrical power or other requirements to support a demonstration should be identified in your written request. Requests for participation must be received not later than one week prior to the date of the meeting. Information from Industry Day may or may not be incorporated into the performance specification and Request for Proposal as appropriate. DCCATS draft performance requirements are as follows: Functional Requirements: The test system shall be capable of performing functional tests (plus clip verify, opens, voltage, shorts, etc.) and functions that provide stimulus, response measurement acquisition and detect pass/fail operation on a CCA/component. Stimulus injection should not cause degradation to the CCA or component. The test system shall be capable of storing and retrieving signature data of known good components to detect faulty components based on the comparisons, and the ability to utilize signature analysis data from existing Gold Disks developed for use on the Huntron 5100DS. The signature information should be able to be graphically viewed and tested in real-time mode. The test system shall be capable of measurement and analog/digital signal injection, by emulating existing GPETE in stand-alone and diagnostic test applications: Digital Multi-Meter (DMM) (AC/DC voltage, current, resistance, diode, capacitance, inductance) Frequency Counter (frequency, period, time AB, unit counter, triggering) ARB/Function Generator (sine, square, triangle, saw, dc offset levels and voltage output (+/-12 volts) Oscilloscope (dual-channel 100Mhz); multi-channel input capability Software Requirements: Test Software: The Test System shall provide operational and developmental software environments for user/developer configurations; functional program library for storing individual Integrated Circuit (IC) function tests; fault log; netlist generator (to aid in schematic generation and trace integrity between components); reverse engineering (to aid in component identification) Built-in-Test: The Test System shall have provision for self-test software that efficiently verifies hardware performance using only internal resources and isolates instrument failure to a single replaceable unit. Special purpose test equipment shall not be required. Operating System: The Test System shall be capable of supporting Windows 2000 Professional, Anti-virus software with the latest DAT virus files, driver and devices required for hardware defined in sections 6 and 7 shall be provided such that any third party developing application software shall not need assistance or information from the contractor for any software development. Interface Requirements: Unit Under Test (UUT) Interfaces: The Test System shall provide test connectors that accommodate several configurations of dip components with dip clip leads (8, 14, 16, 18, 20, 22, 28, 40, etc) for in circuit testing; UUT power harness; universal edge connector adapter (UECA); Zero Insertion Force (ZIF) sockets for components and Insulation Displacement Connector (IDC) interface. External Hardware: The Test System shall be capable of integrating/interfacing with a COTS or common NDI processor controller that meets the following minimum configuration requirements: DCCATS processor shall be a Pentium 4 processor with a clock speed of at least 1 GHz. Future generation processors may be acceptable provided the performance is at least met. 40 GB hard drive DCCATS shall be capable of supporting VGA display with a resolution of 1280 x 1024 DCCATS shall be capable of storing and retrieving data from 3 ?" floppy disk, CD, CDRW, DVD, USB device, modem and network connections DCCATS Modem and network interfaces should support communications through a standard RJ45 and RJ11 connector DCCATS shall be capable of supporting Human Interface Device (HID) - keyboard, mouse, infrared, voice and/or any other new technical device to allow operator/system interaction DCCATS shall be capable of supporting Recommended Standard (RS) -232, RS-485, Universal Serial Bus (USB), IrDA Compliant Infrared, IEEE 1284 Parallel, IEEE 1394 (Firewire). DCCATS shall utilize an open standard architecture system. Power Requirements: The test system shall be a semiconductor device with power requirements of 110 volts 60 Hertz Human Interface Requirements: The DCCATS semiconductor device shall be one-person portable by 90 percent of target audience (maintainers) and limited to 55 lbs Calibration Requirements: The DCCATS shall have provisions for calibration requirements. The DCCATS shall provide complete calibration procedures, calibration software, and any ancillary equipment required, with the exception of calibration standards, for each item identified as requiring calibration. Other Requirements: The DCCATS shall have provisions for breadboard/breakout box for IC test and development (enhancing functional program library); footswitch for hands-free operation when probing; training/tutorial instruction on printed/electronic media and on-site training or a combination thereof; user/developer manuals.
- Record
- SN00344847-W 20030613/030611213700 (fbodaily.com)
- Source
-
FedBizOpps.gov Link to This Notice
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