SOLICITATION NOTICE
66 -- PHILIPS RESEARCH GRADE POWDER X-RAY DEFFRACTOMETER
- Notice Date
- 9/11/2002
- Notice Type
- Solicitation Notice
- Contracting Office
- 3610 Collins Ferry Road (MS-002) P.O. Box 880 Morgantown, WV 26507-0880
- ZIP Code
- 26507-0880
- Solicitation Number
- DE-RQ26-02NT20900
- Point of Contact
- Robert Mohn, Contracting Officer, 412-386-4963, mohn@netl.doe.gov
- Small Business Set-Aside
- N/A
- Description
- SUBJECT: ACQUISITION OF A PHILIPS RESEARCH GRADE POWDER X-RAY DIFFRACTOMETER DESC: The U.S. Department of Energy?s National Energy Technology Labora= tory (NETL), intends to award a purchase order on a sole-source basis to Philips Analytical Inc., Natick, MA for a Research Grade Powder X-Ray Diffractomenter with the following specifications: Full System Specifications Specification for a Theta/ Theta Powder X-Ray Diffraction System Incorporating PreFIX ?Pre-aligned Fast Interchange X-ray optics mounting system.? Configured with Line Focus Incident Beam PreFIX Module. Diffracted Beam to incorpo= rate a NEW Philips high speed X?Celerator Detector with RTMS ?Real Time Multip= le Strip Technology? and a special monochromation device for the X?Celerator providing lower background and suppression of K beta lines. A DOPS ?Direct Optica= l Position Sensing? based goniometer positioning system for high precisio= n and accuracy, 3.0 kW Solid State Generator, 2.2 kW Cu Anode Long Fine Focus= / Flip Focus Ceramic X-Ray Tube, HTK 1200 Hot stage System and Software for da= ta collection, data evaluation and search/ match with automatic report generation from batched recipes (that are True Windows Applications) including installation. 1. Diffractometer Console 1. Fully interlocked sliding double doors with Pb acrylic. 2. Must conform to the German ?Vollschutz? safety standard. 3. Contain a high stability, solid state 3.0kW generator operating at ultra high frequencies. 4. Generator: Maximum settings of at least 60 kV and 60 mA, variation = of HV and anode current will be <0.01 % at 10 % main fluctuation. 5. External connections for power, cooling water and PC. 6. Temporary transport wheels must be available to move the console to= the job site. 2. Ceramic X-ray Tube, Cu Long Fine Focus (0.4 x 12 mm), 2.2kW 1. Cathode should be positioned via a high precision assembly on a cer= amic insulator for unsurpassed positioning and orientation of the focal line= . 2. Electronic x-ray tube recognition system must program the generator= not to surpass the maximum power settings for the tube. 3. Flip focus to allow tube to be rotated for point source to line sou= rce with out requiring any realignment. Must be able to be rotated back in same manner. 4. Must be manufactured by the same company as the system and must car= ry a two year non-prorated full replacement warranty. All subsequent tubes purch= ased must carry the same two-year warranty. 3. Goniometer, Theta/Theta 1. Both axes must be independently positioned using DOPS ?Direct Optic= al Position Sensing? servo control system. 2. Accuracy +/- 0.0025 degrees, Reproducibility +/- 0.0001 degrees B these must be maintained through-out the life of the goniometer, Minimum step= size 0.0001 degrees, 2 theta range 0 to 167 degrees, Variable radius 130 to = 230 mm. 3. Goniometer must have a scan speed of 0.001 to 1.27 deg./s and a sle= w speed of 10 deg./s. 4. Optics 1. Incident beam optics must consist of the following PreFIX ?Pre-alig= ned Fast Interchange X-ray optics? interchangeable module. Interchange of each PreFIX mounted optics assembly described below must occur in less than 2 minut= es without the need for realignment. Dovetail design is not acceptable. 1. INCLUDED 2. Fixed divergence slit prefix mounted. 3. Soller slits of 0.04 radians and beam masks of 2, 5, 10, 15, and 2= 0mm must be provided to limit the lateral divergence of the beam (along the goniometer axis) on the sample. 4. An Incident Beam Anti-Scatter Slit Holder is mounted between the divergence slit and the sample to improve the peak-to-background ratio = of the diffractograms for the X?Celerator high-speed detector b. Diffracted Beam Optics and Detector Must consist of the following Pr= eFIX ?Pre-aligned Fast Interchange X-ray optics? interchangeable module. Interchange of each PreFIX optics assembly described below must occur in less than = 2 minutes without the need for realignment. The purchaser will have the option to purchase any or all of the following optics and Detector modules: 1. INCLUDED Diffracted Beam Optics and Detector 2. A Beam Knife, specific for each type of sample stage, is placed ju= st above the sample surface in the center of the goniometer. The beam knife fur= ther improves peak-to-background ratios, and is particularly important in sc= ans starting at less than ~6=B0 2=E8. 3. A diffracted beam soller slit of equal (or greater) size to the incident soller slit is mounted on the Anti-Scatter Shield. 4. A slot must be available and positioned after the secondary soller= slit for placement of a K-Beta filter or manual beam attenuator. For samples yielding fluorescent radiation (e.g., samples containing h= igh iron levels when Cu radiation is being used), a Philips EXCLUSIVE graphite Diffracted Beam Monochromator must be included for use with high speed X?Celerator Detector. Must be able to use detector with/without monochromator and not need any realignment. 5. Must include a new Philips X?Celerator detection system used for powder diffraction ?Bragg? applications. The system must incorporate Real Tim= e Multiple Strip (RTMS) technology that permits significantly shorter measurement times (up to 100x without a monochromator and 10 - 15x with a monochromator) than conventional detectors, while maintaining or improving signal-to-n= oise characteristics and peak resolution. A PSD is not a suitable alternativ= e. 1. The detector must be capable of measuring from a minimum of 1deg 2= theta and Must maintain linearity over 4,000,000 cps in total over the detect= ors angular range. The detector must NOT require gases, factory calibration= , specific detector maintenance or rebuild on a regular basis, special cooling requirements, and must be mounted on a PreFIX for plug and play style interchange with other detectors. 5. Sample Stages All sample stages must have a PreFIX interface to allow interchange of = each assembly described below without the need for realignment. INCLUDED SAMPLE STAGES: 1. Multi-Purpose sample stage 2. Flat Sample Stage 3. HTK 1200 - Includes High Temperature Camera System, spinner system= for vertical PW3050 goniometers in the PW3040 console. The delivery include= s the complete camera HTK 1200 Sp (AP75750), two sample holders (AP76861) mad= e of Al2O3 ceramics, the temperature control unit, TCU 1000 (AP75755), and a= simple water control device (AP70067). Requires additional goniometer adapter= and vacuum equipment. pre-vacuum pump; turbo molecular high vacuum pump; va= cuum measuring devices; parts for installation. 6. Software X?PERT HIGH SCORE 1. Powerful Search-Match Algorithm. Combines Peak and Profile Data fo= r Optimum results. 2. MDI Multi-Document Interface: Feel of Windows XP, Built for 2000, = NT 3. GUI: Programmable and Settings are Saved per User. 4. Auto-Residue Scoring. Solves Multi-Phase Problems in Seconds. 5. Automatic Phase Identification. 6. Batch Processing and Command Line Interface. Complete Automation o= f Routine Tasks. 7. ICDD Reference Database: Directly readable from ICDD. 8. Supports User Reference Patterns. 9. Advanced Reporting: Direct Interface to MS Word. 10. On-Line Help: Includes Comprehensive HTML Help System. 11. Semi-Quant Analysis: with RIR Reference Intensity Ratio. X?PERT PROFIT, PROFILE FITTING SOFTWARE 1. Crystallite size and micro strain evaluations. 2. Indexing of powder patterns. 3. Structure determinations X?PERT PLUS SOFTWARE WITH DIAMIOND PACKAGE X?Pert Plus is an analytical software program for crystallographic and Rietveld analysis. Additionally, it offers many tools for correction, manipulati= on and simulation of diffraction patterns. It reads all Philips (2Theta) scan files and supports ASCII and binary data formats of all major suppliers. Results from X'Pert PLUS can be read into the included Diamond software for graphical presentation of crystal structures.X?PERT INDUSTRY SOFTWARE FOR QUANTITATIVE ANALYSIS X?Pert Industry is Philips Analytical?s new versatile software platform= for X-ray diffraction analysis in an industrial environment. It is especial= ly designed for use in industrial process control applications and can be set-up according to the specific conditions of the production process. X?Pert Industry offers a highly flexible user interface for configuring= push-button automated analysis routines for operators and can easily be= set-up according to the specific conditions of the production process. X?Pert Industry has been successfully applied by aluminum smelters, cement manufacturer= s and in the pigment industry. Other proven applications include characterizatio= n of zeolites, clay minerals as well as quantitative analysis of bauxite and= respirable silica. New applications for dedicated solutions can be easi= ly generated. You can implement a batch program, optimize the calibration based on your standards and customize the user interface, all according to your = own routine analysis procedures. A flexible report generator for customizab= le presentation of results data is implemented in the program. This allows= the creation of extensive reports, including graphics, conditional texts an= d evaluations of expressions, according to the wishes of the user. 7. Chiller Water to water heat exchanger with a cooling capacity of 3= .85 kW. 8. Computer Dimension7 8200, Pentium7 4 Processor at 2.2GHz w/ 512K L2 Cache Memory: 512MB PC800 RDRAM Keyboard: New Dell7 Enhanced QuietKey Keyboard Monitor: 17 in (17.0 in viewable) 1702FP Digital Flat Panel Display Video Card: 64MB NVIDIA GeForce2 MX Graphics Card with TV-Out Hard Drive: 80GB Ultra ATA/100 Hard Drive Floppy Drive: 3.5 in Floppy Drive Operating System: Microsoft7 Windows7 2000 Professional Mouse: MS IntelliMouse7 Broadband Ready/ Ethernet Network Card: 10/100 PCI Fast Ethernet NIC Modem: 56K PCI Data Fax Modem for Windows DVD-ROM or CD-ROM Drive: 24x/10x/40x CD-RW Drive Sound Card: Integrated Audio with Soundblaster Pro/16 Compatibility Speakers: Harmon Kardon HK-195 Speakers Bundle: Microsoft7 Office XP Small Businesso5 Zip Drives: 250MB Iomega Zip Built-In Drive with One Disk Digital Imaging Software: Image Expert72000 for XP,Dell Edition Limited Warranty, Services and Support Options: 3Yr Ltd. Warranty- 3Yrs= On-Site Service + Lifetime Phone Support 9. Training Customer training on-site 2.5 days. Credit for training class at manufactures site. This purchase order is being issued to Philips Analytical Inc. because = it is the only vendor of x-ray diffractometers that can meet several of the m= ajor specifications required by the US Government. These include the follow= ing: Detector - Philips X?Celerator detection system used for powder diffrac= tion ?Bragg? applications. The system must incorporate Real Time Multiple S= trip (RTMS) technology that permits significantly shorter measurement times = (up to 100x without a monochromator and 10 - 15x with a monochromator) than conventional detectors, while maintaining or improving signal-to-noise characteristics and peak resolution. The detector must be capable of measuring from a minimum of 1 deg. 2 theta and MUST maintain linearity over 4,000= ,000 eps in total over the detectors angular range. The detector must not requi= re gases, factory calibration, specific detector maintenance or rebuild on= a regular basis, special cooling requirements. The detector must be moun= ted on a PreFIX mount for plug and play style interchange with other detectors. = A PSD is not a suitable alternative. Optics Component Mounting System - All components must utilize the PreF= IX ?Pre-aligned Fast Interchange X-ray optics? interchangeable module syst= em. Interchange of each PreFIX mounted optics assembly must occur in less t= han 2 minutes without the need for realignment. Dovetail design is not acceptable. Switchable Ceramic X-ray Tube - X-ray tube is switchable from point to = line focus without the need for realignment. This request is considered to be sole source to Philips Analytical Inc.= Therefore, no solicitation will result from this announcement. All sma= ll business distributors of Philips Analytical may respong to this request= . Other interested parties may identify their interest and capability to satisf= y the Government?s requirements by faxing to Mr. Robert Mohn (FAX 412-386-577= 0) not later than September 23, 2002. Offers submitting a quote must submit descriptive literature and drawings detailing features, technical capabilities and warranty data. Technical acceptability will be determined solely o= n the content and merit of the information submitted response to this provisi= on as it compares to the minimum characteristics provided above. Therefor, it i= s essential that offerors provide sufficient technical literature, documentation, etc., in order for the Government evaluation team to make an adequate technical assessment of the quote as meeting technical acceptability. Price shal= l be the deciding factor among technically acceptable quotes. This award shall b= e made using simplified acquisition procedures. A purchase order will be awar= ded approximately on September 28, 2002. Requests for solicitation will be considered non-responsive. NO TELEPHONE REQUESTS. For technical questions please contact the Technical Representative Mr. Bret Howard, 412-386-59= 08. Request for contract information should be addressed to Mr. Robert L. M= ohn, FAX 412-386-5770 and e-mail mohn@netl.doe.gov.
- Web Link
-
Click here for further details regarding this notice.
(http://e-center.doe.gov/iips/busopor.nsf/Solicitation+By+Number/C5= F3B130BE27B80685256C310078E31C?OpenDocument)
- Record
- SN00163298-W 20020913/020911213344 (fbodaily.com)
- Source
-
FedBizOpps.gov Link to This Notice
(may not be valid after Archive Date)
| FSG Index | This Issue's Index | Today's FBO Daily Index Page |