SOLICITATION NOTICE
66 -- Scanning Electron Microscopes
- Notice Date
- 5/28/2002
- Notice Type
- Solicitation Notice
- Contracting Office
- Department of the Treasury, Bureau of Alcohol, Tobacco and Firearms (ATF), Acquisition and Property Management Division, 650 Massachusetts Avenue, N.W., Room 3290, Washington, DC, 20226
- ZIP Code
- 20226
- Solicitation Number
- Reference-Number-230100000012
- Response Due
- 6/12/2002
- Point of Contact
- James Huff, Contract Specialist, Phone 202-927-7721, Fax 202-927-7311, - James Huff, Contract Specialist, Phone 202-927-7721, Fax 202-927-7311,
- E-Mail Address
-
JMHuff@atfhq.atf.treas.gov, JMHuff@atfhq.atf.treas.gov
- Description
- The Bureau of Alcohol, Tobacco and Firearms (ATF) has a requirement for 2 each Scanning Electron Microscopes (SEM). Must meet all the required functional requirements as follows: Functionality Requirements of the Scanning Electron Microscope: must be computer-controlled with manual override of key operating functions. It must include an Energy Dispersive X-ray System (EDS). The SEM must provide a wide range of discreet accelerating voltages and a differentially evacuated sample chamber equipped with a backscattered electron detector (BEI). The microscope must have an automatic pressure control with manual override. The operator must be able to quickly switch the sample chamber from the differentially evacuated (low pressure) mode to a high vacuum SEM mode where imaging may use either a secondary electron detector (SEI) or the BEI. Other required attributes are: (1) Resolution of at least 3.0nm at high accelerating voltage in the SEI mode and 4.0nm by BEI in the differentially pumped mode. In the high vacuum mode, it must be possible to attain a resolution of 12nm at 1kV at 8mm WD and 3.5nm at 25kV at the analytical working distance. The analytical WD shall be no greater than 10mm and must provide a take-off-angle of at least 35 degrees for EDS analysis. (2) Magnification range from less than 5X to 300kX in at least 130 steps, or continuously. (3) Accelerating voltage adjustable from 300V to 30kV in at least 55 discreet steps-- 100V increments from 300V to at least 3kV. (4) EDS system must meet or surpass the EDAX PhoenixPro Genesis energy dispersive spectrometer including a sapphire detector with digital signal processing, X-ray mapping and digital imaging for the SEM. (PV8306/60 system). Imaging resolution must be at least 8K by 6K. Shall have a mathing and have a flat panel display to that of the SEM. The detector must cool down and be operational within one hour from ambient temperature. System shall be provided with a sinle keyboard/mouse mode of operation for the SEM-EDS. (5) Sample chamber accommodates samples as large as 12 inches in diameter and 3 inches high weighing up to 3 kg. Eucentric tilt stage maintains focus, mag and field of view at all WD positions. Stage travel sufficient to observe a 7 inches diameter sample when combining rotation with X-Y translation (e.g.X=125mm,Y=100mm). Other travel at least 80mm in Z, -10 to 90 degrees of tilt, 360-degree rotation. Motorized, computer controlled mouse, or joystick, drives travel for all axes (X,Y,Z,T,R). Stage speed shall be proportional to, and linked to, magnification. Graphical display of sample stage, showing position of beam on sample and relative position of sample to final lens. Store and recall at least 2000 stored stage coordinates with the operating conditions (e.g., mag, focus, astigmatism, vacuum mode) and automatically position stage to the intersection of cross hairs set by the operator on the display, or to any point in the X, Y, Z, T, R plane either individually or simultaneously. Able to tilt an 8 inches sample up to 45 degrees at a WD as short as 10mm and up to 60 degrees at 20mm. Minimum take-off-angle of 35 degrees, for an EDS detector, with the sample surface perpendicular to the incident beam at a WD of 10mm or less. Sample tilt in the direction of the EDS detector to provide maximum count rates for irregularly shaped samples. The sample stage shall be internal, separate from the SEM door, allowing users to place any given sample directly on the stage, observing its proximity to all detectors prior to closing the door for evacuation. (6) Electron optics with a cartridge-type wehnelt assembly, auto filament saturation, and auto gun alignment-automatic or manual. Electromagnetic beam blanking at operator discretion. Two-stage zoom Condenser Lens (CL) to permit changes in probe current, and/or kV, without the need to change focus, spot position or stigmation. Externally selectable and adjustable Objective Lens (OL) aperture.At least three different aperture diameters to optimize image resolution, depth of focus, and maintain the optimum spot size as the beam current is varied. Capability to add an automated Faraday cup in the column just below the objective lens aperture to accurately measure the true probe current. Dynamic focus capability, linked to mag and WD, for sample tilts of up to 85 degrees. Auto and manual control for focus and OL stigmation. A wobbler to facilitate optimum centering of OL aperture. A sharply conical OL, permitting high tilt of large diameter samples at a short WD. A selection of at least six fixed magnifications that can be instantly utilized from any point in the mag range. (7) Conventional E-T type secondary electron detector, a low vacuum secondary electron detector and a solid state BEI mounted to not restrict any of the sample movement specified above. BEI must permit separation of signal to show pure compositional or topographical image. The ratio of compo to topo signal must be electronically variable. Detector shall allow variable shadow-contrast to enhance topographical features. Location of the BEI must not hinder high resolution SE imaging or limit EDS or any other imaging mode. (8) Vacuum system with a turbomolecular pump rated at least 250 liters/sec, air cooled, and two rotary pumps (RP) rated for at least 100 liters/min. The turbomolecular pump shall be dedicated to evacuation of the SEM in the high vacuum mode of operation and one rotoary pump must be dedicated to the sample chamber for operation in the differentially pumped low vacuum mode. The second rotory pump to improve overall pump down speed. The first rotory pump is fitted with a coaxial foreline trap that is bakeable using an operator-controlled timer. The differential pumping aperture for the column shall be totally separated from the OL aperture so as to allow fine adjustment during low vacuum operation. Fully automated sequencing. Minimum vacuum allowed in LV mode no less than 1Pa from the RP. Water is not required for system. (9) Operating system has keypad, mouse and joystick, with menu selection by either mouse or keypad; mouse control of focus, mag, astigmatism, image shift and stage; and graphical user interface. Storage and recall of unlimited sets of SEM operating conditions from memory to include all column and sample illumination parameters (e.g., kV, bias, mag, CL and OL setting, stigmator coils) and stage positions for at least 10 users operating the SEM intermittently. On-screen operator manipulation of the digital image by: contrast and brightness adjustment; tone reversal; gamma control; psuedo-color display; frame averaging; and pixel integration. Capability to make precise point to point measurements on the displayed digital image. Hard copy output via digital color printer, a Windows-compatible printer; network printers. PC disk drive for images stored as BMP or TIFF files. Automatic control of all major functions, including gun saturation and setting of bias, gun shift and tilt, optimum brightness and contrast after a condition change or moving the sample, focus correction, astigmatism correction, magnification correction for changes in kV and WD. Manual knob control, at operators election, of all functions as well as joystick stage control. Can function with new Genesis softwear from EDAX and subsequent softwear updates. Fine image shift with a minimum operating range of +/- 50um. Control computer must be at least 1.5GHz Pentium IV with 512 MB of RIMM, Window 2000 operating System, 20 GB IDE hard drive, 12X/8X/32X read/write CD, 3.5 inch 1.44 MB floppy drive and one Ethernet card (or equivalent). (10) Measurement scaler consisting of cross-lines to measure features of interest, linked to magnification. Infrared Chamberscope for specimen viewing. Vise holder. Spare wehnelt cap assembly. (11) The supplier must ship the two microscopes FOB destination and install one at the ATF facility in Atlanta and the other one at ATF facility in San Francisco. (12) The supplier must demonstrate to the end user the specified performance of the SEM and EDS systems. (13) The supplier must provide 2 day on-site training in Atlanta and in San Francisco for 2 separate groups (a total of 4 concurrent days in each laboratory). Also, the supplier must provide a minimum 3-day course in operation of the SEM for two operators from ATFs Atlanta forensic lab and two operators from ATFs San Francisco forensic lab. (14) A warranty where the supplier is responsible for any and all defects in materials, workmanship and performance. The warranty must include unlimited emergency service for repairs, and preventive maintenance/adjustments. Shipping will be FOB destination. NO SOLICITATION AVAILABLE. Small businesses are preferred, but not required. Award will be made to the offeror based on best value in the order of the functional and technical specification, past performance and price for the government. Award will be based on meeting the technical specifications listed above on an All or None basis, and the best value to the government. The government may elect to pay a cost premium to select an offeror whose ratings on non-cost evaluation factors (e.g. technical quality and past performance) are superior. A premium is defined as the cost difference between the lowest evaluated cost of a technically acceptable offer and a higher priced offer deemed to be superior from a Technical Quality and / or Past Performance standpoint. This award will be made utilizing simplified acquisitions and procedures under FAR Subpart 13.5. Awardee must be registered in the Department of Defenses (DOD) Central Contractor Registration database (CCR) for electronic Funds Transfer (EFT). All interested parties must submit a quote by June 12th, 2002 no later than 3:00 PM Local Time. Quotes must include price, best delivery time one each to Atlanta, GA and Walnut Creek, CA and product literature information. Quotes are acceptable via facsimile machine at 202/927-7311. NO TELEPHONES REQUESTS OR INQUIRES WILL BE ACCEPTED. Attn: Jim Huff PH# 202/927-7721 NOTE: THIS NOTICE WAS NOT POSTED TO FEDBIZOPPS.GOV ON THE DATE INDICATED IN THE NOTICE ITSELF (28-MAY-2002). IT ACTUALLY FIRST APPEARED ON THE FEDBIZOPPS SYSTEM ON 19-JUL-2002. PLEASE CONTACT fbo.support@gsa.gov REGARDING THIS ISSUE.
- Web Link
-
Link to FedBizOpps document.
(http://www.eps.gov/spg/TREAS/BATF/APMD/Reference-Number-230100000012/listing.html)
- Record
- SN00121832-F 20020721/020719221827 (fbodaily.com)
- Source
-
FedBizOpps.gov Link to This Notice
(may not be valid after Archive Date)
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